ESD III - Latent ESD Damage
ESD events sometimes doesn’t immediately destroy the devices but leaves a “latent defect”. This can cause a device failure later. Latent defects are not caught while testing as the device can work as intended, but reduces the age and reliability of the device considerably. This proves far costlier than an complete damage of the device in that the damage occurs while in use as part of a larger system later in the stage.